Patent Overlay Mapping: Visualizing Technological Distance.
| Title: | Patent Overlay Mapping: Visualizing Technological Distance. |
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| Format: | Journal Article |
| Publication Date: | 2014 |
| Published In: | Journal of the Association for Information Science and Technology |
| Ivan Allen College Contributors: | |
| External Contributors: | Luciano Kay, Ismael Rafols, Nils Newman |
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